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Dr Zicheng Pan

Postdoctoral Research Fellow
School of Electrical Engineering and Computer Science
zicheng.pan@uq.edu.au

Publications

Journal Articles (8)
Conference Papers (6)

Journal Articles

Ren, Jie, An, Yaohui, Lei, Tao, Yang, Junpo, Zhang, Wenyue, Pan, Zicheng, Liao, Yi, Gao, Yongsheng, Sun, Changming and Zhang, Weichuan (2026). Adaptive feature selection-based feature reconstruction network for few-shot learning. Pattern Recognition, 171 (Part B) 112289, 1-10. doi: 10.1016/j.patcog.2025.112289
Pan, Zicheng, Yu, Xiaohan, Zhang, Miaohua, Zhang, Weichuan and Gao, Yongsheng (2025). DyCR: a dynamic clustering and recovering network for few-shot class-incremental learning. IEEE Transactions on Neural Networks and Learning Systems, 36 (4), 7116-7129. doi: 10.1109/tnnls.2024.3394844
Yu, Xiaohan, Pan, Zicheng, Zhao, Yang and Gao, Yongsheng (2025). Self-supervised lie algebra representation learning via optimal canonical metric. IEEE Transactions on Neural Networks and Learning Systems, 36 (2), 3547-3558. doi: 10.1109/tnnls.2024.3355492
Pan, Zicheng, Yu, Xiaohan, Zhang, Weichuan and Gao, Yongsheng (2025). Overcoming learning bias via Prototypical Feature Compensation for source-free domain adaptation. Pattern Recognition, 158 111025, 1-9. doi: 10.1016/j.patcog.2024.111025
Pan, Zicheng, Yu, Xiaohan and Gao, Yongsheng (2025). Session-guided attention in continuous learning with few samples. IEEE Transactions on Image Processing, 34, 2654-2666. doi: 10.1109/TIP.2025.3559463
Pan, Zicheng, Zhang, Weichuan, Yu, Xiaohan, Zhang, Miaohua and Gao, Yongsheng (2024). Pseudo-set frequency refinement architecture for fine-grained few-shot class-incremental learning. Pattern Recognition, 155 110686, 1-12. doi: 10.1016/j.patcog.2024.110686
Bai, Feifei, Cui, Yi, Yan, Ruifeng, Saha, Tapan Kumar, Pan, Zicheng, Zhang, Ge, Zillmann, Matthew and Dart, David (2024). Condition monitoring of distribution power network assets using PMU measurements. IEEE Transactions on Industry Applications, 60 (3), 1-12. doi: 10.1109/tia.2024.3360958
Bai, Feifei, Yan, Ruifeng, Saha, Tapan Kumar, Cui, Yi and Pan, Zicheng (2020). Extraction of dynamic frequency response characteristics and modelling of modern air conditioners. IEEE Transactions on Smart Grid, 12 (1) 9142241, 1-1. doi: 10.1109/tsg.2020.3009841

Conference Papers

Nie, Hongyu, Pan, Zicheng and Gao, Yongsheng (2026). Purification Enhancement Network for Fine-Grained Few-Shot Class Incremental Learning. Springer Science and Business Media Deutschland GmbH. doi: 10.1007/978-981-95-4094-5_2
Yu, Xiaohan, Pan, Zicheng, Zhao, Yang, Zhang, Qin and Gao, Yongsheng (2025). Contrastive Lie Algebra Learning for Ultra-Fine-Grained Visual Categorization. Association for Computing Machinery, Inc. doi: 10.1145/3746027.3755024
Pan, Zicheng, Yu, Xiaohan and Gao, Yongsheng (2024). EIANet: A Novel Domain Adaptation Approach to Maximize Class Distinction with Neural Collapse Principles. British Machine Vision Association, BMVA.
Pan, Zicheng, Yu, Xiaohan, Zhang, Miaohua and Gao, Yongsheng (2023). SSFE-Net: Self-Supervised Feature Enhancement for Ultra-Fine-Grained Few-Shot Class Incremental Learning. 2023 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV), Waikoloa, HI United States, 2-7 January 2023. Piscataway, NJ United States: Institute of Electrical and Electronics Engineers. doi: 10.1109/wacv56688.2023.00621
Pan, Zicheng, Yu, Xiaohan, Zhang, Miaohua and Gao, Yongsheng (2021). Mask-Guided Feature Extraction and Augmentation for Ultra-Fine-Grained Visual Categorization. International Conference on Digital Image Computing - Techniques and Applications (DICTA), Online, 29 November - 1 December 2021. Piscataway, NJ United States: Institute of Electrical and Electronics Engineers. doi: 10.1109/dicta52665.2021.9647389
Yu, Xun, Pan, Zicheng and Gao, Yongsheng (2019). A graph-based image clustering method using mutual information maximization. 2019 IEEE International Conference on Robotics and Biomimetics (ROBIO), Dali, China, 6-08 December 2019. Piscataway, NJ United States: Institute of Electrical and Electronics Engineers. doi: 10.1109/ROBIO49542.2019.8961838
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